• Patent Title: Data analysis apparatus, data analysis method, and computer-readable recording medium
  • Application No.: US17617993
    Application Date: 2019-06-21
  • Publication No.: US12169262B2
    Publication Date: 2024-12-17
  • Inventor: Chenhui Huang
  • Applicant: NEC Corporation
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • International Application: PCT/JP2019/024831 WO 20190621
  • International Announcement: WO2020/255413 WO 20201224
  • Main IPC: G01V20/00
  • IPC: G01V20/00 G06N20/00
Data analysis apparatus, data analysis method, and computer-readable recording medium
Abstract:
A data analysis apparatus 10 includes; an align unit 11 that acquires a pair data of a first data indicating a characteristic of a specific region and a second data corresponding to the first data and indicating another characteristic of the specific region, and aligns the first data in order of their sizes, a classification model generation unit that groups the pair data based on a characteristic of an order distribution of the first data after alignment, classifies the pair data, and generates a classification model for classifying the pair data using the classification result, a regression model generation unit that performs machine learning for each group, using the first data constituting the pair data and the second data constituting the same pair data, and generates a regression model indicating a relation with the first data and the second data.
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