Invention Grant
- Patent Title: Intensity calibration of multipass raman systems using standard reference materials
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Application No.: US17937141Application Date: 2022-09-30
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Publication No.: US12174122B2Publication Date: 2024-12-24
- Inventor: Joseph B. Slater , James M. Tedesco
- Applicant: Endress+Hauser Optical Analysis, Inc.
- Applicant Address: US MI Ann Arbor
- Assignee: Endress+Hauser Optical Analysis, Inc.
- Current Assignee: Endress+Hauser Optical Analysis, Inc.
- Current Assignee Address: US MI Ann Arbor
- Agency: Endress+Hauser (USA) Holding, Inc.
- Agent Kelly J. Smith
- Main IPC: G01N21/65
- IPC: G01N21/65

Abstract:
A calibration reference for a multipass Raman analysis system, wherein a combination excitation and collection beam passes through a focal point F0 within a sample volume multiple times, is provided. The calibration reference includes a body of material having a known spectral response when illuminated by the combination excitation and collection beam. The size or shape of the body is selected or modified to keep the focal point at F0 within the body when the body is positioned within the sample volume for calibration purposes.
Public/Granted literature
- US20240110874A1 INTENSITY CALIBRATION OF MULTIPASS RAMAN SYSTEMS USING STANDARD REFERENCE MATERIALS Public/Granted day:2024-04-04
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