• Patent Title: Facility and method for measuring the thickness of the walls of glass containers
  • Application No.: US17626167
    Application Date: 2020-07-10
  • Publication No.: US12181266B2
    Publication Date: 2024-12-31
  • Inventor: Marc LecontePierre-Yves Solane
  • Applicant: TIAMA
  • Applicant Address: FR Vourles
  • Assignee: TIAMA
  • Current Assignee: TIAMA
  • Current Assignee Address: FR Vourles
  • Agency: Bauer & Joseph
  • Priority: FR1907877 20190712
  • International Application: PCT/FR2020/051257 WO 20200710
  • International Announcement: WO2021/009456 WO 20210121
  • Main IPC: G01B11/06
  • IPC: G01B11/06 G01N21/90 G01N33/38
Facility and method for measuring the thickness of the walls of glass containers
Abstract:
A method for measuring the thickness of glass containers includes the following steps: choosing to measure the radiation emitted by the container from a first side and a second side of the container diametrically opposite to each other; choosing to measure the radiation emitted by the container in a first spectral band in a range between 2,800 nm and 4,000 nm and in a second spectral band; simultaneously measuring, from each side of the container, the intensity of the radiation coming from the walls in the first spectral band and in the second spectral band; and determining at least the thickness of the first wall and of the second wall (22), from the measurements of the intensity of the radiation coming from the first wall in the first and second spectral bands and from the second wall in the first and second spectral bands.
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