- Patent Title: Efficient gradient waveform measurements with variable prephasing
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Application No.: US18164362Application Date: 2023-02-03
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Publication No.: US12189004B2Publication Date: 2025-01-07
- Inventor: Kevin Harkins , Mark D. Does
- Applicant: Vanderbilt University
- Applicant Address: US TN Nashville
- Assignee: Vanderbilt University
- Current Assignee: Vanderbilt University
- Current Assignee Address: US TN Nashville
- Agency: Blank Rome LLP
- Main IPC: G01R33/24
- IPC: G01R33/24 ; G01R33/565

Abstract:
Accurate measurement of gradient waveform errors can often improve image quality in sequences with time varying readout and excitation waveforms. Self-encoding or offset-slice method sequences are commonly used to measure gradient waveforms. However, the self-encoding method requires a long scan time, while the offset-slice method is often low precision, requiring the thickness of the excited slice to be small compared to the maximal k-space encoded by the test waveform. This disclosure describes a novel hybrid of those methods, referred to as variable-prephasing (VP). Like the offset-slice method, VP uses the change in signal phase from offset-slices to calculate the gradient waveform. Similar to the self-encoding method, repeated acquisitions with a variable amplitude self-encoding gradient mitigates the signal loss due to phase wrapping, which, in-turn, allows thicker slices and greater SNR.
Public/Granted literature
- US20230251340A1 EFFICIENT GRADIENT WAVEFORM MEASUREMENTS WITH VARIABLE PREPHASING Public/Granted day:2023-08-10
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