Invention Grant
- Patent Title: Optical trap calibration apparatus and method based on variation of electric field by optical imaging of nanoparticle
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Application No.: US17691125Application Date: 2022-03-10
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Publication No.: US12189110B2Publication Date: 2025-01-07
- Inventor: Cuihong Li , Zhenhai Fu , Jing Jiang , Zhiming Chen , Yuanyuan Ma , Huizhu Hu
- Applicant: ZHEJIANG LAB , ZHEJIANG UNIVERSITY
- Applicant Address: CN Zhejiang; CN Zhejiang
- Assignee: ZHEJIANG LAB,ZHEJIANG UNIVERSITY
- Current Assignee: ZHEJIANG LAB,ZHEJIANG UNIVERSITY
- Current Assignee Address: CN Zhejiang; CN Zhejiang
- Agency: W&G Law Group
- Priority: CN202110445513.3 20210425
- Main IPC: G02B21/32
- IPC: G02B21/32 ; G21K1/00 ; G01N15/00

Abstract:
Disclosed is an optical trap calibration apparatus and method based on variation of electric field by optical imaging of a nanoparticle. By means of a direct optical imaging method, a linear nanoparticle equilibrium position displacement under the action of a constant electric field is measured to realize calibration, thereby avoiding the introduction of error signals, and improving the reliability of differential calibration. The specific calibration method and apparatus of the present invention are not only suitable for calibration of electric field quantity, but also suitable for the calibration of other magnetic forces and the like. By means of the accurate calibration of mechanical quantity in the present invention, the development and application of the vacuum optical trap sensing technology can be promoted.
Public/Granted literature
Information query
IPC分类:
G | 物理 |
G02 | 光学 |
G02B | 光学元件、系统或仪器 |
G02B21/00 | 显微镜 |
G02B21/32 | .结构上与显微镜组合的微型控制器 |