Invention Grant
- Patent Title: Monitoring method and system for machine tool
-
Application No.: US17241479Application Date: 2021-04-27
-
Publication No.: US12214462B2Publication Date: 2025-02-04
- Inventor: Chun-Yu Tsai , Chi-Chen Lin , Sheng-Ming Ma , Ta-Jen Peng
- Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: TW109145291 20201221
- Main IPC: B23Q17/12
- IPC: B23Q17/12 ; B23Q17/09 ; G01B17/08 ; G05B19/18 ; G05B19/4063 ; G06N20/00

Abstract:
A monitoring method and a monitoring system for a machine tool to machine a workpiece are provided. The monitoring method includes the following steps. First, a vibration signal of a spindle of the machine tool is detected. Next, a vibration feature value of the vibration signal is obtained. Whether the vibration feature value exceeds a threshold condition is determined, wherein the threshold condition is determined by a training model based on a predetermined surface quality of the workpiece. When the vibration feature value exceeds the threshold condition, a machining parameter of the machine tool is adjusted.
Public/Granted literature
- US20220193852A1 MONITORING METHOD AND SYSTEM FOR MACHINE TOOL Public/Granted day:2022-06-23
Information query