Invention Grant
- Patent Title: Memory device detecting weakness of operation pattern and method of operating the same
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Application No.: US18052469Application Date: 2022-11-03
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Publication No.: US12236993B2Publication Date: 2025-02-25
- Inventor: Jungmin You
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2021-0171202 20211202,KR10-2022-0052229 20220427
- Main IPC: G11C11/406
- IPC: G11C11/406 ; G11C11/408

Abstract:
Provided are a memory device for detecting a weakness of an operation pattern and a method of operating the same. The method includes: storing address information and activation count information regarding N word lines from among the plurality of word lines in a register including N entries; based on activation of a first word line different from the N word lines, storing address information and activation count information regarding the first word line in an entry from which information is evicted from among the N entries; and generating first weakness information based on a number of evictions performed on the register during a first period.
Public/Granted literature
- US20230178136A1 MEMORY DEVICE DETECTING WEAKNESS OF OPERATION PATTERN AND METHOD OF OPERATING THE SAME Public/Granted day:2023-06-08
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