Invention Grant
- Patent Title: Semiconductor devices including insulation patterns with different carbon concentrations
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Application No.: US17712319Application Date: 2022-04-04
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Publication No.: US12237385B2Publication Date: 2025-02-25
- Inventor: Bongkwan Baek , Junghwan Chun , Jongmin Baek , Koungmin Ryu
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2021-0099667 20210729
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/768 ; H01L29/06 ; H01L29/417 ; H01L29/423 ; H01L29/786

Abstract:
A semiconductor device includes a gate structure disposed on a substrate; a source and drain layer disposed on the substrate adjacent the gate structure; a first contact plug disposed on the source and drain layer, an insulation pattern structure disposed on the first contact plug, the insulation pattern structure including insulation patterns having different carbon concentrations; and a second contact plug disposed on the gate structure.
Public/Granted literature
- US20230036104A1 SEMICONDUCTOR DEVICES Public/Granted day:2023-02-02
Information query
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