Invention Grant
- Patent Title: Three-dimensional-measuring-apparatus inspection gauges, three-dimensional-measuring-apparatus inspection methods and three-dimensional measuring apparatuses
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Application No.: US17974698Application Date: 2022-10-27
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Publication No.: US12241737B2Publication Date: 2025-03-04
- Inventor: Yuto Inoue , Masayuki Nara
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: IGreenblum & Bernstein, P.L.C.
- Priority: JP2021-177083 20211029
- Main IPC: G01B5/008
- IPC: G01B5/008 ; G01B5/012 ; G01B21/04
Abstract:
A three-dimensional-measuring-apparatus inspection gauge includes a plurality of targets to be measured with which a tip of a probe of a three-dimensional measuring apparatus comes into contact; and a frame member that supports the plurality of targets. The plurality of targets are arranged in positions corresponding to each vertex of a triangular prism.
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