Invention Application
- Patent Title: Surface texture measuring instrument, surface texture measuring method and stylus radius measuring instrument
- Patent Title (中): 表面纹理测量仪，表面纹理测量方法和测针半径测量仪
-
Application No.: US09805935Application Date: 2001-03-15
-
Publication No.: US20010029778A1Publication Date: 2001-10-18
- Inventor: Isamu Takemura
- Applicant: MITUTOYO CORPORATION
- Applicant Address: null
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: null
- Priority: JP2000-090417 20000329
- Main IPC: B23Q017/09
- IPC: B23Q017/09 ; G01N019/02
Abstract:
A Stylus 1 is moved along the surface of a workpiece 20 and the surface texture of the workpiece 20 is measured based on the displacement of the stylus 1 in the Z direction. A spherical reference gage of known radius is measured with the stylus 1 in advance and radius values r of the tip sphere of the stylus 1 are calculated according to angle by subtracting the radius R of the reference gage from the measured values. The actual contour of workpiece 20 is calculated by using the radius values r as the correction data according to angle and subtracting the correction values according to angle from the measured data obtained by movement along the surface of workpiece 20.
Public/Granted literature
Information query
