Invention Application
US20020031981A1 Carrier head with a substrate detection mechanism for a chemical mechanical polishing system 有权
载体头,具有用于化学机械抛光系统的基底检测机构

  • Patent Title: Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
  • Patent Title (中): 载体头,具有用于化学机械抛光系统的基底检测机构
  • Application No.: US09989498
    Application Date: 2001-11-19
  • Publication No.: US20020031981A1
    Publication Date: 2002-03-14
  • Inventor: Boris GovzmanSteven M. ZunigaHung ChenSasson Somekh
  • Main IPC: B24B049/00
  • IPC: B24B049/00 B24B051/00
Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
Abstract:
A carrier head for a chemical mechanical polishing system includes a substrate sensing mechanism. The carrier head includes a base and a flexible member connected to the base to define a chamber. A lower surface of the flexible member provides a substrate receiving surface. The substrate sensing mechanism includes a sensor to measure a pressure in the chamber and generate an output signal representative thereof, and a processor configured to indicate whether the substrate is attached to the substrate receiving surface in response to the output signal.
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