Invention Application
US20020031981A1 Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
有权
载体头,具有用于化学机械抛光系统的基底检测机构
- Patent Title: Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
- Patent Title (中): 载体头,具有用于化学机械抛光系统的基底检测机构
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Application No.: US09989498Application Date: 2001-11-19
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Publication No.: US20020031981A1Publication Date: 2002-03-14
- Inventor: Boris Govzman , Steven M. Zuniga , Hung Chen , Sasson Somekh
- Main IPC: B24B049/00
- IPC: B24B049/00 ; B24B051/00

Abstract:
A carrier head for a chemical mechanical polishing system includes a substrate sensing mechanism. The carrier head includes a base and a flexible member connected to the base to define a chamber. A lower surface of the flexible member provides a substrate receiving surface. The substrate sensing mechanism includes a sensor to measure a pressure in the chamber and generate an output signal representative thereof, and a processor configured to indicate whether the substrate is attached to the substrate receiving surface in response to the output signal.
Public/Granted literature
- US06517415B2 Carrier head with a substrate detection mechanism for a chemical mechanical polishing system Public/Granted day:2003-02-11
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