Invention Application
US20020088919A1 Light probe microscope 有权
光探针显微镜

  • Patent Title: Light probe microscope
  • Patent Title (中): 光探针显微镜
  • Application No.: US10027061
    Application Date: 2001-12-26
  • Publication No.: US20020088919A1
    Publication Date: 2002-07-11
  • Inventor: Hiroshi Muramatsu
  • Priority: JP2001-004059 20010111; JP2001-189784 20010622
  • Main IPC: G01J001/00
  • IPC: G01J001/00
Light probe microscope
Abstract:
According to the conventional light detection of a light probe microscope, there have been a problem that an excessive stray light is detected in case that a detector whose light-intercepting face is large with respect to the size of a bright point is used, and a problem that an optical axis alignment is necessary in case that the detector having a small light-intercepting face in the order of the bright point is used. Besides, in order to obtain plural optical information, plural light detectors have been necessary. It is adapted such that, by using a two-dimensional image sensor, a two-dimensional image is obtained in real time, and a signal intensity of an optional detection region in the two-dimensional image is obtained by picture signal processing means. It is adapted such that plural information are image-formed on the two-dimensional image sensor, and plural detection regions are designated.
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