发明申请
US20020153903A1 Device and method for testing and calibrating multi-meters in a cathode ray tube production line
审中-公开
在阴极射线管生产线上测试和校准多米的装置和方法
- 专利标题: Device and method for testing and calibrating multi-meters in a cathode ray tube production line
- 专利标题(中): 在阴极射线管生产线上测试和校准多米的装置和方法
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申请号: US09839282申请日: 2001-04-20
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公开(公告)号: US20020153903A1公开(公告)日: 2002-10-24
- 发明人: David Allen Murtishaw , David Michael Cataldo , Walter A. Brendel JR.
- 申请人: Sony Corporation and Sony Electronics Inc.
- 申请人地址: null
- 专利权人: Sony Corporation and Sony Electronics Inc.
- 当前专利权人: Sony Corporation and Sony Electronics Inc.
- 当前专利权人地址: null
- 主分类号: G01R035/00
- IPC分类号: G01R035/00
摘要:
A jig can be used to site-test the accuracy of multi-meters that are used to measure resistances in a cathode ray tube production line without having to remove those multi-meters from the production line or ship them to a third party service provider for the testing. The jig is a box of electronics that includes a variety of known resistance loads that can be selected and then measured by a multi-meter to test and/or calibrate that meter. The jig includes a number of known resistance loads, a device for selecting a particular resistance load and electric contacts for connecting a multi-meter to the jig so that the meter can measure the selected and known resistance load. By comparing the measured and known resistance values, the accuracy of the multi-meter is tested.
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