Invention Application
- Patent Title: Process for material-removing machining of both sides of semiconductor wafers
- Patent Title (中): 用于半导体晶片两侧材料去除加工的工艺
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Application No.: US10174139Application Date: 2002-06-18
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Publication No.: US20030054650A1Publication Date: 2003-03-20
- Inventor: Guido Wenski , Thomas Altmann , Gerhard Heier , Wolfgang Winkler , Gunther Kann
- Applicant: WACKER SILTRONIC GESELLSCHAFT FUR HALBLEITERMATERIALIEN AG
- Applicant Address: null
- Assignee: WACKER SILTRONIC GESELLSCHAFT FUR HALBLEITERMATERIALIEN AG
- Current Assignee: WACKER SILTRONIC GESELLSCHAFT FUR HALBLEITERMATERIALIEN AG
- Current Assignee Address: null
- Priority: DE10132504.5 20010705
- Main IPC: H01L021/461
- IPC: H01L021/461

Abstract:
A process is for material-removing machining, on both sides simultaneously, of semiconductor wafers having a front surface and a back surface, the semiconductor wafers resting in carriers which are set in rotation by means of an annular outer drive ring and an annular inner drive ring and being moved between two oppositely rotating working disks in a manner which can be described by means of in each case one path curve relative to the upper working disk and one path curve relative to the lower working disk, wherein the two path curves after six loops around the center have the appearance of still being open, and at each point have a radius of curvature which is at least as great as the radius of the inner drive ring.
Public/Granted literature
- US06793837B2 Process for material-removing machining of both sides of semiconductor wafers Public/Granted day:2004-09-21
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