Invention Application
US20030075694A1 Ultraviolet light permeable filter for flaw detection light and method for detection of flaws 失效
用于探伤光的紫外线透过滤光片及其缺陷检测方法

  • Patent Title: Ultraviolet light permeable filter for flaw detection light and method for detection of flaws
  • Patent Title (中): 用于探伤光的紫外线透过滤光片及其缺陷检测方法
  • Application No.: US10050827
    Application Date: 2002-01-18
  • Publication No.: US20030075694A1
    Publication Date: 2003-04-24
  • Inventor: Masami Motoyama
  • Applicant: Marktec Corporation
  • Applicant Address: JP Tokyo
  • Assignee: Marktec Corporation
  • Current Assignee: Marktec Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JP11-338041 19991129
  • Main IPC: G01J001/00
  • IPC: G01J001/00
Ultraviolet light permeable filter for flaw detection light and method for detection of flaws
Abstract:
An ultraviolet light permeable filter for an ultraviolet detection light is equipped on a filter glass surface with a dielectric multi-film layer which allows a visible radiation of wave length from 694 nm to 780 nm to reflect on the layer. The wave length also does not penetrate through the multi-flim layer. This filter prevents a reddish halation occurrence during an inspection display of a flaw detection light, which is the main cause of overlooking a scratch or flaw pattern.
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