Invention Application
- Patent Title: Ultraviolet light permeable filter for flaw detection light and method for detection of flaws
- Patent Title (中): 用于探伤光的紫外线透过滤光片及其缺陷检测方法
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Application No.: US10050827Application Date: 2002-01-18
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Publication No.: US20030075694A1Publication Date: 2003-04-24
- Inventor: Masami Motoyama
- Applicant: Marktec Corporation
- Applicant Address: JP Tokyo
- Assignee: Marktec Corporation
- Current Assignee: Marktec Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP11-338041 19991129
- Main IPC: G01J001/00
- IPC: G01J001/00

Abstract:
An ultraviolet light permeable filter for an ultraviolet detection light is equipped on a filter glass surface with a dielectric multi-film layer which allows a visible radiation of wave length from 694 nm to 780 nm to reflect on the layer. The wave length also does not penetrate through the multi-flim layer. This filter prevents a reddish halation occurrence during an inspection display of a flaw detection light, which is the main cause of overlooking a scratch or flaw pattern.
Public/Granted literature
- US06563126B1 Ultraviolet light permeable filter for flaw detection light and method for detection of flaws Public/Granted day:2003-05-13
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