Invention Application
- Patent Title: Monitoring system for an industrial process using one or more multidimensional variables
- Patent Title (中): 使用一个或多个多维变量的工业过程监控系统
-
Application No.: US10172433Application Date: 2002-06-13
-
Publication No.: US20030109951A1Publication Date: 2003-06-12
- Inventor: Chang-Meng B. Hsiung , Bethsabeth Munoz , Ajoy Kumar Roy , Michael Gregory Steinthal , Steven A. Sunshine , Michael Allen Vicic , Shou-Hua Zhang
- Main IPC: G06F019/00
- IPC: G06F019/00

Abstract:
A system for monitoring an industrial process and taking action based on the results of process monitoring. Actions taken may include process control, paging, voicemail, and input for e-enterprise systems. The system includes an input module for receiving a plurality of parameters from a process for manufacture of a substance or object. The system also includes a library module. The library module includes a plurality of computer aided processes. Any one of the computer aided processes is capable of using each of the plurality of parameters to compare at least two of the plurality of parameters against a training set of parameters. The training set of parameters is generally predetermined. The computer aided process is also capable of determining if the at least two of the plurality of parameters are within a predetermined range of the training set of parameters. Additionally, the system includes an output module for outputting a result based upon the training set and the plurality of parameters.
Public/Granted literature
- US06985779B2 Monitoring system for an industrial process using one or more multidimensional variables Public/Granted day:2006-01-10
Information query