Invention Application
- Patent Title: Apparatus and method for recording mark
- Patent Title (中): 记录标记的装置和方法
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Application No.: US10374715Application Date: 2003-02-27
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Publication No.: US20030174615A1Publication Date: 2003-09-18
- Inventor: Seong-sue Kim , Du-seop Yoon , In-sik Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD
- Applicant Address: KR Suwon-City
- Assignee: SAMSUNG ELECTRONICS CO., LTD
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD
- Current Assignee Address: KR Suwon-City
- Priority: KR2002-27866 20020520
- Main IPC: G11B007/00
- IPC: G11B007/00

Abstract:
A recording apparatus to record a mark on a recording medium includes an aberration detecting part and an optical power controller. The aberration detecting part detects an aberration signal corresponding to the amount of an aberration contained in a light beam radiated onto a recording surface of the recording medium by using an optical pickup system which includes a light source and an objective lens. The light source emits a light beam having a power to record the mark on the recording medium. The objective lens condenses the light beam to focus the light beam as an optical spot on the recording surface of the recording medium. The optical power controller controls the power output from the light source according to the detected aberration signal, so as to have the light source output an optical power to record the mark, in which a deformation due to the aberration is compensated for, on the recording medium. Accordingly, even though the aberration occurs, a proper mark in which the deformation due to the aberration is compensated for can be recorded by increasing the recording power of the light source in proportion to the amount of the aberration to compensate for the aberration. As a result, the mark showing a good signal characteristic can be recorded on the recording medium without an additional aberration compensating device.
Public/Granted literature
- US07095703B2 Apparatus and method for recording mark Public/Granted day:2006-08-22
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