发明申请
US20030187599A1 Circuit for measuring rising or falling time of high-speed data and method thereof
审中-公开
用于测量高速数据上升或下降时间的电路及其方法
- 专利标题: Circuit for measuring rising or falling time of high-speed data and method thereof
- 专利标题(中): 用于测量高速数据上升或下降时间的电路及其方法
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申请号: US10315024申请日: 2002-12-10
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公开(公告)号: US20030187599A1公开(公告)日: 2003-10-02
- 发明人: Du-sik Yoo , Young-boo Kim , Jin-mo Jang
- 优先权: KR2002-18054 20020402
- 主分类号: G06F019/00
- IPC分类号: G06F019/00
摘要:
A circuit and a method for measuring rising or falling time of high-speed data are disclosed. The circuit includes a comparator and a storage circuit. The comparator receives the high-speed data via a first port and a reference signal via a second port, compares a level of the high-speed data with a level of the reference signal in response to an enable signal, and outputs the compared result as a signal. A reference signal generator generates the reference signal. An enable signal generator generates the enable signal. The storage circuit receives and stores the signal and measures the rising or falling time of the high-speed data.
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