Invention Application
- Patent Title: Method and apparatus for performing dynamic mechanical analyses
- Patent Title (中): 用于进行动态力学分析的方法和装置
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Application No.: US10405824Application Date: 2003-04-02
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Publication No.: US20030188585A1Publication Date: 2003-10-09
- Inventor: Ulrich Esser , Thomas Hutter
- Applicant: Mettler-Toledo GmbH
- Applicant Address: null
- Assignee: Mettler-Toledo GmbH
- Current Assignee: Mettler-Toledo GmbH
- Current Assignee Address: null
- Priority: DE10214756.6 20020403
- Main IPC: G01N003/08
- IPC: G01N003/08

Abstract:
In a dynamic mechanical analysis, a test specimen (2) is coupled to an excitation device (4) by means of a holder device (3). The excitation device (4) applies an excitation force comprised of a static pre-tensioning force component and a time-variable force component to the test specimen, and a deformation of the test specimen (2) is measured by means of one or more displacement sensors (5). The method includes a test phase with the steps: applying the excitation force to the test specimen; while said excitation force is in effect, determining at least one decision parameter, said decision parameter being indicative of a degree of slack in said coupling of the test specimen; comparing said decision parameter to at least one reference value; based on said comparison, determining whether or not the test specimen is coupled to the excitation device in a completely slack-free state, so that physical values derived from said measurements of the deformation will not be subject to errors caused by an insufficient amount of said pre-tensioning force component.
Public/Granted literature
- US06880385B2 Method and apparatus for performing dynamic mechanical analyses Public/Granted day:2005-04-19
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