发明申请
US20030231024A1 Capacitive media resistivity, dialectic constant, and thickness sensor
审中-公开
电容介质电阻率，辩证常数和厚度传感器
- 专利标题： Capacitive media resistivity, dialectic constant, and thickness sensor
- 专利标题（中）： 电容介质电阻率，辩证常数和厚度传感器
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申请号： US10170764申请日： 2002-06-12
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公开(公告)号： US20030231024A1公开(公告)日： 2003-12-18
- 发明人: Phillip R. Luque
- 主分类号： G01R027/26
- IPC分类号： G01R027/26
摘要：
This invention relates to a method and apparatus for measuring the resistivity, dialectic constant, and thickness of a media. Such structures of this type, generally, employ a pair of interdigital capacitive sensors that contact only one side of the media. An AC voltage is used to measure capacitance between the interdigital capacitive sensors. The capacitance readings from the sensors can be combined to compute the dialectic constant and the thickness of the media.
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