发明申请
- 专利标题: Specimen holder having an insert for atomic force microscopy
- 专利标题(中): 样品架具有用于原子力显微镜的插入件
-
申请号: US10732076申请日: 2003-12-10
-
公开(公告)号: US20040120862A1公开(公告)日: 2004-06-24
- 发明人: Anton Lang , Rainer Wogritsch , Andreas Nowak
- 申请人: Leica Mikrosysteme GmbH
- 申请人地址: AT Vienna
- 专利权人: Leica Mikrosysteme GmbH
- 当前专利权人: Leica Mikrosysteme GmbH
- 当前专利权人地址: AT Vienna
- 优先权: DEDE10258104.5 20021211
- 主分类号: B01L003/00
- IPC分类号: B01L003/00
摘要:
A specimen holder (10) is proposed in order to create a capability for preparing, in a cutting device, in particular a microtome or ultramicrotome, a specimen that is to examined in an AFM. The specimen holder (10) is embodied in several parts. It comprises an insert (12) in which the specimen is secured. Also provided is a receiving ring (14) in which the insert (12) can be received. The insert together with the receiving ring (14) is mounted, in particular thread-joined, on a base element (16). As a result of the mounting of the receiving ring (14) on the base element (16), the insert together with the specimen is fixed in its position.
公开/授权文献
信息查询