Invention Application
- Patent Title: Energy filter and electron microscope
- Patent Title (中): 能量过滤器和电子显微镜
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Application No.: US10738966Application Date: 2003-12-17
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Publication No.: US20040144920A1Publication Date: 2004-07-29
- Inventor: G. Martinez Lopez , Katsushige Tsuno
- Applicant: JEOL Ltd.
- Applicant Address: JP Akishima
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Akishima
- Priority: JP2002-364935 20021217
- Main IPC: H01J049/44
- IPC: H01J049/44

Abstract:
An energy filter with reduced aberration. The energy filter has a first stage of filter for receiving an electron beam entering along the optical axis and for focusing the beam in one direction vertical to the optical axis and a second stage of filter positioned along the optical axis behind the first stage of filter. The beam once focused by the first stage of filter is made to enter the second stage of filter. In the second stage of filter, the orbit of the electron beam is inverted with respect to the focal point. The two stages of filters are identical in length taken along the optical axis. The first and second stages of filters have electric and magnetic quadrupole fields, respectively, along the optical axis. These quadrupole fields make an angle of 45 degrees to the optical axis to achieve astigmatic focusing.
Public/Granted literature
- US06960763B2 Energy filter and electron microscope Public/Granted day:2005-11-01
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