发明申请
US20040235213A1 Oxygen-doped AI-containing current blocking layers in active semiconductor devices
有权
有源半导体器件中含氧掺杂的含AI电流阻挡层
- 专利标题: Oxygen-doped AI-containing current blocking layers in active semiconductor devices
- 专利标题(中): 有源半导体器件中含氧掺杂的含AI电流阻挡层
-
申请号: US10875418申请日: 2004-06-24
-
公开(公告)号: US20040235213A1公开(公告)日: 2004-11-25
- 发明人: Fred A. Kish JR. , Sheila K. Mathis , Charles H. Joyner , Richard P. Schneider
- 主分类号: H01L021/00
- IPC分类号: H01L021/00
摘要:
An active semiconductor device, such as, buried heterostructure semiconductor lasers, LEDs, modulators, photodiodes, heterojunction bipolar transistors, field effect transistors or other active devices, comprise a plurality of semiconductor layers formed on a substrate with one of the layers being an active region. A current channel is formed through this active region defined by current blocking layers formed on adjacent sides of a designated active region channel where the blocking layers substantially confine the current through the channel. The blocking layers are characterized by being an aluminum-containing Group III-V compound, i.e., an Al-III-V layer, intentionally doped with oxygen from an oxide source. Also, wet oxide process or a deposited oxide source may be used to laterally form a native oxide of the Al-III-V layer. An example of a material system for this invention useful at optical telecommunication wavelengths is InGaAsP/InP where the Al-III-V layer comprises InAlAs:O or InAlAs:O:Fe. Other materials for the blocking layers may be InAlGaAs or alternating layers or alternating monolayers of AlAs/InAs. Thus, the O-doped blocking layers may be undoped, impurity doped or co-doped with Fe.
公开/授权文献
信息查询