Invention Application
US20040263450A1 Method and apparatus for measuring response time of liquid crystal, and method and apparatus for driving liquid crystal display device using the same
有权
用于测量液晶的响应时间的方法和装置,以及用于驱动使用其的液晶显示装置的方法和装置
- Patent Title: Method and apparatus for measuring response time of liquid crystal, and method and apparatus for driving liquid crystal display device using the same
- Patent Title (中): 用于测量液晶的响应时间的方法和装置,以及用于驱动使用其的液晶显示装置的方法和装置
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Application No.: US10874547Application Date: 2004-06-24
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Publication No.: US20040263450A1Publication Date: 2004-12-30
- Inventor: Oh Hyun Lee , Don Gyou Lee , Jung Ho Kil
- Applicant: LG Philips LCD Co., Ltd.
- Applicant Address: null
- Assignee: LG Philips LCD Co., Ltd.
- Current Assignee: LG Philips LCD Co., Ltd.
- Current Assignee Address: null
- Priority: KRP2003-43805 20030630
- Main IPC: G09G003/36
- IPC: G09G003/36

Abstract:
The method and apparatus for measuring response time of liquid crystal includes controlling temperature of a liquid crystal display panel, generating a liquid crystal driving signal having a variable voltage level that is changed according to a response property of the liquid crystal display panel and a target voltage level, and supplying the liquid crystal driving signal to the liquid crystal display panel, detecting the response property corresponding to the liquid crystal driving signal, and adjusting the variable voltage level until the response property reaches a desired level and setting a modulated data substantially equal to the variable voltage level when the response property reaches the desired level, the modulated data based on temperatures being determined by changing the temperature of the liquid crystal display panel. Also, method and apparatus for driving a LCD device using the above-described method.
Public/Granted literature
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