发明申请
US20050023460A1 Methods and apparatus for determining the state of a variable resistive layer in a material stack 有权
用于确定材料堆叠中的可变电阻层的状态的方法和装置

  • 专利标题: Methods and apparatus for determining the state of a variable resistive layer in a material stack
  • 专利标题(中): 用于确定材料堆叠中的可变电阻层的状态的方法和装置
  • 申请号: US10628526
    申请日: 2003-07-28
  • 公开(公告)号: US20050023460A1
    公开(公告)日: 2005-02-03
  • 发明人: Michael BrownLuke Johnson
  • 申请人: Michael BrownLuke Johnson
  • 主分类号: G11B9/04
  • IPC分类号: G11B9/04 G11B11/00
Methods and apparatus for determining the state of a variable resistive layer in a material stack
摘要:
A method and an apparatus for detecting a number of variation in resistance within a material stack in response to a scanning and injection of a non-contacting electron stream into a material stack, the material stack having a first conductive contact layer, a variable resistive layer, a fixed resistive layer, and a second conductive contact layer, and the variations in resistance within the material stack being based on one of a plurality of resistive states of the variable resistive layer. The method also includes generating two magnetic fields within a transformer, the transformer being operatively coupled to the first and second conductive contact layers and generating a differential output signal within the transformer based on the two magnetic fields, the differential output signal being associated with one of the plurality of resistive states.
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