Invention Application
- Patent Title: Performance measurement system
- Patent Title (中): 性能测量系统
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Application No.: US10791808Application Date: 2004-03-04
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Publication No.: US20050027479A1Publication Date: 2005-02-03
- Inventor: Sang-in Lee
- Applicant: Sang-in Lee
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR2003-49307 20030718
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G01M99/00 ; G21C17/00

Abstract:
A performance test system includes a measuring device to measure an object device, and a computing device having a controller to test performance of the object device based on measured data transmitted from the measuring device, wherein the controller controls to display a report setup window through which data to be reflected in a measurement report is inputted, a coordinate-system setup window through which a coordinate system is set up based on the object device, and a measuring option setup window through which options for measuring the performance of the object device are set up, controls operation of the measuring device and the object device based on the options set up through the measuring option setup window, and tests the performance of the object device based on the measured data transmitted from the measuring device according to the operation of the object device and the measuring device, and controls to display a report window to process and to output report data inputted through the report setup window and the measured data transmitted from the measuring device. The present invention provides a performance measurement system, in which performance of an object device is measured, the performance measurement is reported with measured data and various report data, and an interface convenient for a user is provided.
Public/Granted literature
- US07050937B2 Performance measurement system Public/Granted day:2006-05-23
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