Invention Application
US20050035771A1 Impedance measuring circuit, it's method, and capacitance measuring circuit 失效
阻抗测量电路,它的方法和电容测量电路

  • Patent Title: Impedance measuring circuit, it's method, and capacitance measuring circuit
  • Patent Title (中): 阻抗测量电路,它的方法和电容测量电路
  • Application No.: US10488679
    Application Date: 2002-09-06
  • Publication No.: US20050035771A1
    Publication Date: 2005-02-17
  • Inventor: Masami YakabeNaoki Ikeuchi
  • Applicant: Masami YakabeNaoki Ikeuchi
  • Priority: JP2001-270877 20010906
  • International Application: PCT/JP02/09137 WO 20020906
  • Main IPC: G01N27/22
  • IPC: G01N27/22 G01R27/26 H04R29/00
Impedance measuring circuit, it's method, and capacitance measuring circuit
Abstract:
An electrostatic capacitance detection circuit 10 comprises a DC voltage generator 11, an operational amplifier 14 of which non-inverting input terminal is connected to specific potential, an impedance converter 16, a resistance (R1) 12 connected between the DC voltage generator 11 and an inverting input terminal of the operational amplifier 14, a resistance (R2) 13 connected between the inverting input terminal of the operational amplifier 14 and an output terminal of the impedance converter 16, and a capacitor 15 connected between an output terminal of the operational amplifier 14 and an input terminal of the impedance converter 16. A capacitor to be detected 17 is connected between the input terminal of the impedance converter 16 and specific potential.
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