发明申请
US20050035773A1 Apparatus and method for detecting thermoelectric properties of materials
审中-公开
用于检测材料热电性能的装置和方法
- 专利标题: Apparatus and method for detecting thermoelectric properties of materials
- 专利标题(中): 用于检测材料热电性能的装置和方法
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申请号: US10639008申请日: 2003-08-11
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公开(公告)号: US20050035773A1公开(公告)日: 2005-02-17
- 发明人: Youqi Wang , C. Ramberg , Michael Yee
- 申请人: Youqi Wang , C. Ramberg , Michael Yee
- 专利权人: Symyx Technologies, Inc.
- 当前专利权人: Symyx Technologies, Inc.
- 主分类号: G01K7/02
- IPC分类号: G01K7/02 ; G01R27/08
摘要:
Apparatus and methods are provided for efficiently and non-destructively determining the thermal properties of materials having arbitrary surface textures. Two regions of a sample are each contacted by respective pairs of probes, where each pair includes a first probe made of a first material and a second probe made of a second material. A voltage sensor is arranged between the two probes of each pair, and between the probes of the same material from each pair. Nodes connect the voltage sensors to the probes. A temperature gradient is established between the two regions, while the nodes are maintained at a constant temperature. The Seebeck coefficient of the material and the temperatures of the regions can be determined from the voltages measured by the voltage sensors.