A management system for managing information of monitor wafers stored in a storage center includes an operation rule module for determining the next manufacturing process for each of the monitor wafers according to its wafer number and wafer condition, an information update module for updating the information of the monitor wafers in a database according to the results made by the operation rule module, an inventory module for computing an inventory quantity of the monitor wafers according to the wafer numbers and the wafer conditions of the monitor wafers, a warning module for checking whether the inventory quantity of the monitor wafers is less than the quantity of the safety stock or not and sending a warning message when the inventory quantity of the monitor wafers is less than the quantity of the safety stock, and a display module for showing the wafer conditions and the inventory quantity of the monitor wafers.