发明申请
US20050051775A1 Semiconductor pixel arrays with reduced sensitivity to defects 有权
具有降低的缺陷敏感性的半导体像素阵列

  • 专利标题: Semiconductor pixel arrays with reduced sensitivity to defects
  • 专利标题(中): 具有降低的缺陷敏感性的半导体像素阵列
  • 申请号: US10655248
    申请日: 2003-09-04
  • 公开(公告)号: US20050051775A1
    公开(公告)日: 2005-03-10
  • 发明人: Guy Meynants
  • 申请人: Guy Meynants
  • 主分类号: H01L27/146
  • IPC分类号: H01L27/146 H01L29/04 H04N5/3745
Semiconductor pixel arrays with reduced sensitivity to defects
摘要:
A pixel structure is described, comprising at least two selection switches coupled in series to improve the yield of the pixel. Also an array comprising such pixel structures logically organised in rows and columns is described, as well as a method for selecting a row or column of pixel structures in such an array.
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