发明申请
US20050056635A1 Heater inspection apparatus and semiconductor manufacturing apparatus having heater inspection apparatus mounted thereon
失效
具有安装在其上的加热器检查装置的加热器检查装置和半导体制造装置
- 专利标题: Heater inspection apparatus and semiconductor manufacturing apparatus having heater inspection apparatus mounted thereon
- 专利标题(中): 具有安装在其上的加热器检查装置的加热器检查装置和半导体制造装置
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申请号: US10670337申请日: 2003-09-26
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公开(公告)号: US20050056635A1公开(公告)日: 2005-03-17
- 发明人: Masayuki Suzuki , Hideo Ishizu
- 申请人: Masayuki Suzuki , Hideo Ishizu
- 申请人地址: JP Shinjuku-ku
- 专利权人: Kokusai Electric Semiconductor Service Inc.
- 当前专利权人: Kokusai Electric Semiconductor Service Inc.
- 当前专利权人地址: JP Shinjuku-ku
- 优先权: JP2003-97153 20030331; JP2003-97157 20030331; JP2003-322390 20030916
- 主分类号: H05B3/00
- IPC分类号: H05B3/00 ; F27D19/00 ; F27D21/00 ; H01L21/00 ; H01L21/205 ; H01L21/324 ; H05B1/02
摘要:
To find the deterioration degree of a heater that heats a furnace. The present invention includes: a current detector 21 that detects a level of a current flowing through a heater 7 that is heated based on a commercial power source 1; a voltage detector 20 that detects a level of a voltage applied to the heater 7; a temperature detector 22 that detects a temperature of the heater 7; a table memory 14 on which a temperature coefficient of resistance for use in calculation of a resistance of the heater 7 at a time of manufacture is stored; and a CPU 17A that calculates a resistance of the heater 7 at an inspection time based on respective detection results by the voltage detector 20 and the current detector 21 and calculates the resistance of the heater 7 at a reference time based on a detection result by the temperature detector 22 and the temperature coefficient of resistance stored on the table memory 14, thereby finding the deterioration degree of the heater 7 based on the resistance of the heater 7 at the inspection time and the resistance of the heater 7 at the reference time.
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