发明申请
- 专利标题: Surface hardness distribution measuring method and apparatus
- 专利标题(中): 表面硬度分布测量方法和装置
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申请号: US10940731申请日: 2004-09-15
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公开(公告)号: US20050061062A1公开(公告)日: 2005-03-24
- 发明人: Makoto Kaneko , Shinji Tanaka , Tomohiro Kawahara , Shinji Takeuchi
- 申请人: Makoto Kaneko , Shinji Tanaka , Tomohiro Kawahara , Shinji Takeuchi
- 申请人地址: JP Higashihiroshima-shi JP Higashihiroshima-shi JP Saitama-shi JP Hiroshima-shi
- 专利权人: Makoto Kaneko,Tomohiro Kawahara,Fuji Photo Optical Co., Ltd.,Shinji Tanaka
- 当前专利权人: Makoto Kaneko,Tomohiro Kawahara,Fuji Photo Optical Co., Ltd.,Shinji Tanaka
- 当前专利权人地址: JP Higashihiroshima-shi JP Higashihiroshima-shi JP Saitama-shi JP Hiroshima-shi
- 优先权: JP2003-327638 20030919
- 主分类号: G01N3/40
- IPC分类号: G01N3/40 ; G01N3/06 ; G01N33/02 ; G01N3/00
摘要:
It is possible to blast air on a surface portion of a measured object from a hole of pressing means, project illumination light in a concentric pattern with an optical element and shoot the measured object with a CCD so as to visually grasp hardness distribution on the surface portion from distortion of the concentric pattern displayed on an observed image. As for the hardness distribution, it is possible to detect luminance distribution of a measured object image obtained by the CCD so as to display the concentric pattern which is the luminance distribution as a conspicuous representation of the hardness distribution. And the luminance distribution can also be represented in the concentric pattern by multiplying a luminance value by an overflowing coefficient.
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