发明申请
- 专利标题： Method of calculating occurrence frequency of sequence, method of calulating degree of isolation and method of estimating degree of adequacy for primer
- 专利标题（中）： 计算序列发生频率的方法，计算隔离度的方法和估算引物充足程度的方法
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申请号： US10500373申请日： 2002-12-27
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公开(公告)号： US20050071089A1公开(公告)日： 2005-03-31
- 发明人: Shinichi Morishita , Tomoyuki Yamada
- 申请人： Shinichi Morishita , Tomoyuki Yamada
- 优先权： JP2001-396194 20011227
- 国际申请： PCT/JP02/13815 WO 20021227
- 主分类号： G06F17/30
- IPC分类号： G06F17/30 ; G06F19/20 ; G06F19/22 ; G01N33/50 ; G01N33/48 ; G06F19/00
摘要：
It is intended to support a unique design of a primer. To calculate an indication showing the occurrence frequency of a sequence in a genome sequence, the occurrence frequencies of partial sequences having a definite length in the genome sequences are calculated. Then the occurrence of frequency of each partial sequence of the definite length is stored in an incidence/isolation degree table (16). Concerning each partial sequence of the definite length, a degree of isolation i, which means that j mutation indicating the conversion of j bases (j=
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