Invention Application
- Patent Title: Method of making a semiconductor transistor
- Patent Title (中): 制造半导体晶体管的方法
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Application No.: US10917165Application Date: 2004-08-11
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Publication No.: US20050079660A1Publication Date: 2005-04-14
- Inventor: Anand Murthy , Boyan Boyanov , Ravindra Soman , Robert Chau
- Applicant: Anand Murthy , Boyan Boyanov , Ravindra Soman , Robert Chau
- Main IPC: H01L21/225
- IPC: H01L21/225 ; H01L21/336 ; H01L21/8238 ; H01L29/165 ; H01L29/45 ; H01L29/78 ; H01L21/8234

Abstract:
Transistors are manufactured by growing germanium source and drain regions, implanting dopant impurities into the germanium, and subsequently annealing the source and drain regions so that the dopant impurities diffuse through the germanium. The process is simpler than a process wherein germanium is insitu doped with p-type or n-type impurities. The dopant impurities diffuse easily through the germanium but not easily through underlying silicon, so that an interface between the germanium and silicon acts as a diffusion barrier and ensures positioning of the dopant atoms in the regions of the device where they improve transistor performance.
Public/Granted literature
- US06933589B2 Method of making a semiconductor transistor Public/Granted day:2005-08-23
Information query
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