发明申请
- 专利标题: Self-monitoring metals, alloys and materials
- 专利标题(中): 自我监测金属,合金和材料
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申请号: US10937105申请日: 2004-09-08
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公开(公告)号: US20050083032A1公开(公告)日: 2005-04-21
- 发明人: Neil Goldfine , Vladimir Zilberstein , David Grundy , Andrew Washabaugh , Darrell Schlicker , Ian Shay , Robert Lyons , Christopher Craven , Christopher Root , Mark Windoloski , Volker Weiss
- 申请人: Neil Goldfine , Vladimir Zilberstein , David Grundy , Andrew Washabaugh , Darrell Schlicker , Ian Shay , Robert Lyons , Christopher Craven , Christopher Root , Mark Windoloski , Volker Weiss
- 申请人地址: US MA Waltham
- 专利权人: JENTEK Sensors, Inc.
- 当前专利权人: JENTEK Sensors, Inc.
- 当前专利权人地址: US MA Waltham
- 主分类号: G01N27/00
- IPC分类号: G01N27/00 ; G01N27/02 ; G01N27/24 ; G01N27/90
摘要:
Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.
公开/授权文献
- US07188532B2 Self-monitoring metals, alloys and materials 公开/授权日:2007-03-13
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