Invention Application
- Patent Title: Scanning exposure method and an apparatus thereof
- Patent Title (中): 扫描曝光方法及其装置
-
Application No.: US10841306Application Date: 2004-05-06
-
Publication No.: US20050094117A1Publication Date: 2005-05-05
- Inventor: Tean-Sen Jen
- Applicant: Tean-Sen Jen
- Priority: TW92130120 20031029
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G03B27/42

Abstract:
A light source and a substrate are placed above and below a mask having a mask pattern thereon, respectively. Relative to the mask, the light source is moved in a first direction at a first speed, and the substrate is moved in a second direction at a second speed. The light of the light source transfers the mask pattern to a photoresist layer on the substrate, and forms a photoresist pattern thereof.
Public/Granted literature
- US07106418B2 Scanning exposure method and an apparatus thereof Public/Granted day:2006-09-12
Information query
IPC分类: