Invention Application
US20050094117A1 Scanning exposure method and an apparatus thereof 有权
扫描曝光方法及其装置

  • Patent Title: Scanning exposure method and an apparatus thereof
  • Patent Title (中): 扫描曝光方法及其装置
  • Application No.: US10841306
    Application Date: 2004-05-06
  • Publication No.: US20050094117A1
    Publication Date: 2005-05-05
  • Inventor: Tean-Sen Jen
  • Applicant: Tean-Sen Jen
  • Priority: TW92130120 20031029
  • Main IPC: G03F7/20
  • IPC: G03F7/20 G03B27/42
Scanning exposure method and an apparatus thereof
Abstract:
A light source and a substrate are placed above and below a mask having a mask pattern thereon, respectively. Relative to the mask, the light source is moved in a first direction at a first speed, and the substrate is moved in a second direction at a second speed. The light of the light source transfers the mask pattern to a photoresist layer on the substrate, and forms a photoresist pattern thereof.
Public/Granted literature
Information query
Patent Agency Ranking
0/0