发明申请
US20050098482A1 Handling system for dual side inspection 审中-公开
双面检查处理系统

Handling system for dual side inspection
摘要:
The invention is a novel automated apparatus for optically inspecting both sides of manufactured components for manufacturing defects. The invention can be used to inspect either ferrous or non-ferrous components. The apparatus comprises a first and a second rotable disc and either a first and a second nonrotable magnet or a first and second nonrotable vacuum plenum. The first rotable disc rotates in a first direction and the second rotable disc rotates in a second direction. Components are either magnetically held to each disc or held by vacuum. At a transfer station, a bottom surface of the second rotable disc partially overlaps a top surface of the first rotable disc, and components are transferred from the first rotable disc to the second rotable disc.
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