发明申请
摘要:
The present invention describes a test structure with a first set of features which is a subset of product features; and a second set of features adjacent to the first set of features, the second set occupying a smaller area than the first set and the second set being similar to the first set yet being distinguishable from surrounding structures.
公开/授权文献
- US07514274B2 Enhanced uniqueness for pattern recognition 公开/授权日:2009-04-07
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