发明申请
- 专利标题: Thermal processing apparatus and a thermal processing method
- 专利标题(中): 热处理装置和热处理方法
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申请号: US10960762申请日: 2004-10-08
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公开(公告)号: US20050121142A1公开(公告)日: 2005-06-09
- 发明人: Ken Nakao , Takanobu Asano , Hiroki Fukushima , Katsuya Okumura
- 申请人: Ken Nakao , Takanobu Asano , Hiroki Fukushima , Katsuya Okumura
- 优先权: JP2003-355147 20031015
- 主分类号: H01L21/31
- IPC分类号: H01L21/31 ; C23C16/02 ; H01L21/00 ; H01L21/205 ; H01L21/304 ; H01L21/324 ; C23F1/00
摘要:
Substrates having surfaces in a highly clean condition are subjected to a thermal process in a heating furnace. In a thermal processing apparatus for processing substrates by a predetermined thermal process that heats the substrates by a heating means, the substrates are held in a vertical position at horizontal intervals in a reaction vessel. Cleaning liquids are supplied into the reaction vessel to clean the substrates, and then the cleaning liquids are drained away through a drain port, and then a process gas is supplied into the reaction vessel to process the substrates by a thermal process. The substrates having the cleaned clean surfaces are subjected to the thermal process without being exposed to the ambient atmosphere and can be satisfactorily processed by the thermal process.
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