发明申请
- 专利标题: Method and apparatus for measuring shape of bumps
- 专利标题(中): 用于测量凸块形状的方法和装置
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申请号: US10964690申请日: 2004-10-15
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公开(公告)号: US20050129304A1公开(公告)日: 2005-06-16
- 发明人: Hideaki Sasazawa , Mineo Nomoto , Masatoshi Yamaga , Chikara Iwata , Masashi Uehara
- 申请人: Hideaki Sasazawa , Mineo Nomoto , Masatoshi Yamaga , Chikara Iwata , Masashi Uehara
- 优先权: JP2003-357510 20031017
- 主分类号: G01B11/24
- IPC分类号: G01B11/24 ; G01B11/06 ; G06K9/00 ; G06T7/00 ; H05K3/40 ; H05K3/46
摘要:
The present invention provides a bump shape measuring apparatus comprising an illumination optical system which illuminates bumps arranged on a board with illumination light of a low tilt angle to a surface of the board; a detection optical system where reflected light from the bumps is condensed for detection of image signals of the bumps by a high tilt angle to the surface of the board; an image processing unit where an outline of the tip and the base of each of the bumps is calculated based on the image signals of each of the bumps, and geometric characteristics including at least a position and height of each of the bumps are calculated based on the outline of the tip and the base of each of the bumps; and a main control unit where information on the calculated geometric characteristics of the bumps is displayed on a display unit.
公开/授权文献
- US07336816B2 Method and apparatus for measuring shape of bumps 公开/授权日:2008-02-26
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