发明申请
- 专利标题: Characteristics adjustment method of image forming apparatus, manufacturing method of image forming apparatus and characteristics adjustment apparatus of image forming apparatus
- 专利标题(中): 图像形成装置的特征调整方法,图像形成装置的制造方法以及图像形成装置的特性调整装置
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申请号: US11049996申请日: 2005-02-04
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公开(公告)号: US20050148272A1公开(公告)日: 2005-07-07
- 发明人: Akihiko Yamano , Mitsutoshi Kuno , Shuji Aoki , Takahiro Oguchi
- 申请人: Akihiko Yamano , Mitsutoshi Kuno , Shuji Aoki , Takahiro Oguchi
- 申请人地址: JP TOKYO
- 专利权人: CANON KABUSHIKI KAISHA
- 当前专利权人: CANON KABUSHIKI KAISHA
- 当前专利权人地址: JP TOKYO
- 优先权: JP2001-304610 20010928
- 主分类号: H01J9/44
- IPC分类号: H01J9/44 ; G09G3/00 ; G09G3/22 ; H01J9/02 ; H01J9/42 ; H01J31/12 ; H01J9/00 ; H01J9/46
摘要:
There is provided a characteristic adjustment method for an image forming apparatus that is provided with a multi-electron source in which a plurality of electron-emitting devices are electrically connected by wiring and arranged on a substrate and a fluorescent member for emitting light by irradiation of an electron beam, the method including: a measurement step of dividing a display portion of the image forming apparatus into a plurality of areas and measuring light emitting characteristics of at least one or more of the electron-emitting devices in the respective divided areas, and a shifting step of shifting the light emitting characteristics of the electron-emitting devices in the divided areas to individual characteristic target values by applying a characteristic shift voltage to the electron-emitting devices.
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