发明申请
- 专利标题: Sealed condition inspection device
- 专利标题(中): 密封状态检查装置
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申请号: US10500001申请日: 2002-12-25
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公开(公告)号: US20050151529A1公开(公告)日: 2005-07-14
- 发明人: Toshiro Ishida
- 申请人: Toshiro Ishida
- 申请人地址: CH PULLY CH-1009
- 专利权人: TETRA LAVAL HOLDINGS & FINANCE S.A.
- 当前专利权人: TETRA LAVAL HOLDINGS & FINANCE S.A.
- 当前专利权人地址: CH PULLY CH-1009
- 优先权: JP2001-400523 20011228
- 国际申请: PCT/JP02/13497 WO 20021225
- 主分类号: B29C65/82
- IPC分类号: B29C65/82 ; B65B51/10 ; B65B57/00 ; G01M3/18 ; G01M3/40 ; G01N27/24
摘要:
A sealed condition inspecting device comprising a support unit for supporting an element to be inspected for a sealed condition, a pair of electrodes in contact with the portion to be inspected of the element to be inspected and supported by the support unit, an electrical variable detecting unit for detecting an electrical variable in the portion to be inspected, and a sealed condition judging means for judging the acceptability of a sealed condition based on the electrical variable. In fact, since the acceptability of a sealed condition is judged based on an electrical variable in the portion to be inspected, whether or not a defective sealed condition has occurred can be determined independently of the subjectivity of the operator, whereby a sealed condition can be inspected for a sealed condition without unpacking them, not only inspection work can be simplified but reliability in the quality of an element to be inspected can be improved.
公开/授权文献
- US07251986B2 Sealed condition inspection device 公开/授权日:2007-08-07
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