发明申请
- 专利标题: Wafer level chip stack method
- 专利标题(中): 晶圆级芯片堆叠方式
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申请号: US10944002申请日: 2004-09-20
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公开(公告)号: US20050153522A1公开(公告)日: 2005-07-14
- 发明人: Hyeon Hwang , Dong-Kuk Kim , Ki-Kwon Jeong
- 申请人: Hyeon Hwang , Dong-Kuk Kim , Ki-Kwon Jeong
- 优先权: KR2004-1464 20040109
- 主分类号: H01L21/60
- IPC分类号: H01L21/60 ; H01L21/00 ; H01L21/44 ; H01L21/48 ; H01L21/58 ; H01L21/68 ; H01L21/78 ; H01L21/98 ; H01L25/065
摘要:
Provided is a method by which differently-sized chips may be stacked at the wafer level. The wafer level chip stack method utilizes first and second wafer assemblies that support first and second wafers on adhesive tapes. One or both of the supported wafers may be sawed or otherwise divided to obtain separate first and second chips that remain fixed to respective first ring frames. The first and second wafer assemblies may then be positioned and aligned so that a back surface of the second wafer faces an active surface of the first wafer. Each of the second chips may then be bonded to a corresponding first chip to form a chip stack using an adhesive layer. The chip stacks may then be detached from the wafer assemblies and attached to a substrate.
公开/授权文献
- US07294531B2 Wafer level chip stack method 公开/授权日:2007-11-13
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