发明申请
- 专利标题: Run-length violation detection circuitry and methods for using the same
- 专利标题(中): 运行长度违例检测电路及其使用方法
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申请号: US11087217申请日: 2005-03-22
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公开(公告)号: US20050162289A1公开(公告)日: 2005-07-28
- 发明人: Vinson Chan , Chong Lee , Huy Ngo
- 申请人: Vinson Chan , Chong Lee , Huy Ngo
- 专利权人: Altera Corporation
- 当前专利权人: Altera Corporation
- 主分类号: H03M5/14
- IPC分类号: H03M5/14 ; H03M7/00 ; H03M7/46
摘要:
Circuitry for detecting excessive runs of similar bits of data in a data stream is provided. The data stream is typically received as serial data operating in a serial clock domain. The circuitry of this of this invention checks the received data for run-length violations while operating in a slower parallel clock domain, as opposed to the faster serial clock domain. An advantage of operating run-length detection circuitry in the parallel domain is that longer length run-length violations can be searched for in the received data, as compared to run-length detectors that operate in the serial domain. Another advantage of the invention is that the run-length violation signal can be provided to utilization circuitry asynchronously. This enables utilization circuitry to quickly capture the signal despite differences in clock domains (i.e., the clock domain of the detection circuitry and the clock domain of the utilization circuitry).
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