发明申请
US20050201152A1 CIRCUIT AND A METHOD TO SCREEN FOR DEFECTS IN AN ADDRESSABLE LINE IN A NON-VOLATILE MEMORY
有权
电路和非易失性存储器中可寻址线路中缺陷的屏蔽方法
- 专利标题： CIRCUIT AND A METHOD TO SCREEN FOR DEFECTS IN AN ADDRESSABLE LINE IN A NON-VOLATILE MEMORY
- 专利标题（中）： 电路和非易失性存储器中可寻址线路中缺陷的屏蔽方法
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申请号： US10797156申请日： 2004-03-09
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公开(公告)号： US20050201152A1公开(公告)日： 2005-09-15
- 发明人: Hung Nguyen , Steve Choi , Loc Hoang , Alexander Kotov
- 申请人： Hung Nguyen , Steve Choi , Loc Hoang , Alexander Kotov
- 主分类号： G11C15/00
- IPC分类号： G11C15/00 ; G11C16/06 ; G11C29/00
摘要：
A circuit to screen for defects in an addressable line in a non-volatile memory array comprises a current mirror circuit which has a plurality of mirroring stages. The current mirror circuit is connected to the addressable line and receives a control signal and mirrors the control signal to provide a current to the addressable line. In a preferred embodiment, the current mirror circuit provides a high voltage current to the addressable line which is used to effectuate an operation such as program or erase to the memory cells connected to the addressable line. The change in state or the absence of change in state of the memory cells connected to the addressable line can be used to screen for defects in the addressable line.
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