Invention Application
- Patent Title: Method for estimating long term end-of-life characteristics using short-term data for lithium/silver vanadium oxide cells
- Patent Title (中): 使用锂/银钒氧化物电池的短期数据估算长期寿命终止特性的方法
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Application No.: US11087302Application Date: 2005-03-23
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Publication No.: US20050216212A1Publication Date: 2005-09-29
- Inventor: Kenneth Syracuse , Noelle Waite , Hong Gan , Esther Takeuchi
- Applicant: Kenneth Syracuse , Noelle Waite , Hong Gan , Esther Takeuchi
- Main IPC: G01R31/36
- IPC: G01R31/36 ; G06F19/00
Abstract:
The present invention is directed to a method for analyzing the tail-end behavior of a lithium cell having a solid cathode. The tail of a longer-term accelerated discharge data (ADD) test is estimated from the tail of two shorter-term ADD tests. This is accomplished by first comparing the discharge tails of shorter-term ADD tests and determining angles or rotation that correspond to Rdc growth, and then trending rotation angles versus time to reach a give DoD. For example, the 18-month and 36-month ADD test tails are used to estimate the ADD test tail of a similarly constructed cell subjected to a longer-term ADD test, for example a 48-month ADD test.
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