发明申请
- 专利标题： Method for estimating long term end-of-life characteristics using short-term data for lithium/silver vanadium oxide cells
- 专利标题（中）： 使用锂/银钒氧化物电池的短期数据估算长期寿命终止特性的方法
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申请号： US11087302申请日： 2005-03-23
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公开(公告)号： US20050216212A1公开(公告)日： 2005-09-29
- 发明人: Kenneth Syracuse , Noelle Waite , Hong Gan , Esther Takeuchi
- 申请人： Kenneth Syracuse , Noelle Waite , Hong Gan , Esther Takeuchi
- 主分类号： G01R31/36
- IPC分类号： G01R31/36 ; G06F19/00
摘要：
The present invention is directed to a method for analyzing the tail-end behavior of a lithium cell having a solid cathode. The tail of a longer-term accelerated discharge data (ADD) test is estimated from the tail of two shorter-term ADD tests. This is accomplished by first comparing the discharge tails of shorter-term ADD tests and determining angles or rotation that correspond to Rdc growth, and then trending rotation angles versus time to reach a give DoD. For example, the 18-month and 36-month ADD test tails are used to estimate the ADD test tail of a similarly constructed cell subjected to a longer-term ADD test, for example a 48-month ADD test.
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