发明申请
- 专利标题: Phase calibration method and apparatus
- 专利标题(中): 相位校准方法和装置
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申请号: US10920994申请日: 2004-08-18
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公开(公告)号: US20050219118A1公开(公告)日: 2005-10-06
- 发明人: Tokuro Kubo , Kazuo Nagatani , Hajime Hamada , Hiroyoshi Ishikawa , Nobukazu Fudaba
- 申请人: Tokuro Kubo , Kazuo Nagatani , Hajime Hamada , Hiroyoshi Ishikawa , Nobukazu Fudaba
- 优先权: JPJP2004-099260 20040330
- 主分类号: H04J1/00
- IPC分类号: H04J1/00 ; G01S7/40 ; H01Q3/26 ; H04B1/707 ; H04B7/08 ; H04B7/10 ; H04L27/26
摘要:
Disclosed is a phase calibration method for inserting a calibration signal (SC) into main signals (SM1 to SMn) of a plurality of branches in turn, estimating the phase characteristic of an analog circuit to which a respective one of the main signals is input and calibrating the phase of each main signal. The method includes steps of outputting a first combined signal obtained by combining output signals from the analog circuits (62a to 62n) in all branches, outputting a second combined signal obtained by combining the main signals in all branches, extracting the calibration signal by removing the second combined signal from the first combined signal in a calibration signal extracting unit (64), estimating the phase characteristics of the analog circuits, to which the main signals having the inserted calibration signal are input, based upon a change in phase of the calibration signal, and subjecting the main signals to phase adjustment having characteristics that are opposite the phase characteristics.
公开/授权文献
- US07106249B2 Phase calibration method and apparatus 公开/授权日:2006-09-12
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