发明申请
US20050219973A1 METHOD FOR CHOOSING THE DEFECT DETECTION MODE OF AN OPTICAL STORAGE DEVICE 有权
用于选择光存储器件的缺陷检测模式的方法

METHOD FOR CHOOSING THE DEFECT DETECTION MODE OF AN OPTICAL STORAGE DEVICE
摘要:
At least one detection area on an optical storage medium is allocated for data storage first, and then the detection area is set to a defect detection mode of either write detection or write verification, depending on the number of defects stated in a previous defect record. If the detection area is the write detection mode and the number of accumulated defects exceeds a default threshold value, the detection area would be configured anew and thereby set to a defect detection mode of write verification.
信息查询
0/0