发明申请
US20050219973A1 METHOD FOR CHOOSING THE DEFECT DETECTION MODE OF AN OPTICAL STORAGE DEVICE
有权
用于选择光存储器件的缺陷检测模式的方法
- 专利标题: METHOD FOR CHOOSING THE DEFECT DETECTION MODE OF AN OPTICAL STORAGE DEVICE
- 专利标题(中): 用于选择光存储器件的缺陷检测模式的方法
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申请号: US10904886申请日: 2004-12-02
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公开(公告)号: US20050219973A1公开(公告)日: 2005-10-06
- 发明人: Kuo-Wen Jin , Shou-Ren Tsai , Wei-Guan Yau
- 申请人: Kuo-Wen Jin , Shou-Ren Tsai , Wei-Guan Yau
- 申请人地址: TW Hsinchu City
- 专利权人: Mediatek Inc.
- 当前专利权人: Mediatek Inc.
- 当前专利权人地址: TW Hsinchu City
- 优先权: TW093108873 20040331
- 主分类号: G11B5/09
- IPC分类号: G11B5/09 ; G11B7/0045 ; G11B20/18
摘要:
At least one detection area on an optical storage medium is allocated for data storage first, and then the detection area is set to a defect detection mode of either write detection or write verification, depending on the number of defects stated in a previous defect record. If the detection area is the write detection mode and the number of accumulated defects exceeds a default threshold value, the detection area would be configured anew and thereby set to a defect detection mode of write verification.
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