发明申请
US20050229051A1 Delay detecting apparatus of delay element in semiconductor device and method thereof
失效
半导体装置中的延迟元件的延迟检测装置及其方法
- 专利标题： Delay detecting apparatus of delay element in semiconductor device and method thereof
- 专利标题（中）： 半导体装置中的延迟元件的延迟检测装置及其方法
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申请号： US11017646申请日： 2004-12-22
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公开(公告)号： US20050229051A1公开(公告)日： 2005-10-13
- 发明人: Tae-Yun Kim , Hwang Hur , Jun-Gi Choi
- 申请人： Tae-Yun Kim , Hwang Hur , Jun-Gi Choi
- 优先权： KR2004-24031 20040408
- 主分类号： G11C29/00
- IPC分类号： G11C29/00 ; G11C29/02
摘要：
A delay detecting apparatus detects delay amounts of delay elements in a semiconductor device by using a test mode. The semiconductor device comprises a delay signal detecting unit for detecting delays of delay elements in the semiconductor device by using a signal that is synchronized with an external clock, and a delay signal outputting unit for outputting a delayed signal from the delay signal detecting unit to a data pad by using the signal that is synchronized with the external clock.
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