Invention Application
US20050235183A1 Restricted scan reordering technique to enhance delay fault coverage
失效
限制扫描重排序技术，增强延时故障覆盖
- Patent Title: Restricted scan reordering technique to enhance delay fault coverage
- Patent Title (中): 限制扫描重排序技术，增强延时故障覆盖
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Application No.: US10892022Application Date: 2004-07-15
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Publication No.: US20050235183A1Publication Date: 2005-10-20
- Inventor: Seongmoon Wang , Wei Li , Srimat Chakradhar
- Applicant: Seongmoon Wang , Wei Li , Srimat Chakradhar
- Applicant Address: US NJ Princeton
- Assignee: NEC Laboratories America, Inc.
- Current Assignee: NEC Laboratories America, Inc.
- Current Assignee Address: US NJ Princeton
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3185 ; G06F17/50
Abstract:
The present invention is directed to improved delay fault testing by optimizing the order of scan cells in a scan chain.
Public/Granted literature
- US07188323B2 Restricted scan reordering technique to enhance delay fault coverage Public/Granted day:2007-03-06
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